X-Strata 920

The Oxford Instruments' X-Strata920 is a high performance, compact, rugged and reliable quality-control analyser for simple, rapid, coating thickness measurement and composition analysis. Measurements can be made according to International test methods, ISO 3497 and ASTMB568.TheX-Strata920 has as its source of excitation a field proven Oxford Instruments X-ray tube fitted with a high performance xenondetector.

CMI 760

The 760 measures both surface copper and through-hole copper. This highly expandable bench top system is capable of both micro- resistance and eddy-current testing, amounting in accurate and precise measurement of both surface copper and through-hole copper.

FT230

The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’ itself, making it possible to analyze many more parts within a single shift.
Automation and innovative software are what makes the FT230 analyzer. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the FT230 takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.